Highlights

Susi, T., et al., Single-atom spectroscopy of phosphorus dopants implanted into graphene, 2D Materials 4, 021013 (2017). doi:10.1088/2053-1583/aa5e78

Susi, T., et al., Nitrogen-Doped Single-Walled Carbon Nanotube Thin Films Exhibiting Anomalous Sheet Resistances, Chem. Mater. 23, 2201-2208 (2011). doi: 10.1021/cm200111b

Susi, T., et al., Nitrogen-doped SWCNTs synthesized using ammonia and carbon monoxide, Phys. Stat. Solidi B 247, 2726-2729 (2010). doi: 10.1002/pssb.201000312

Electron energy loss spectroscopy

Recent advances in instrumentation have made it possible to identify the composition of materials at the atomic scale using electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM). When combined with modeling, even the exact nature of the bonding of single atoms can be elucidated.