Highlights

Zagler, G., et al., Beam-driven dynamics of aluminium dopants in graphene, 2D Materials 9, 035009 (2022). doi:10.1088/2053-1583/ac6c30

Elibol, K., et al., Single Indium Atoms and Few-Atom Indium Clusters Anchored onto Graphene via Silicon Heteroatoms, ACS Nano 15(9), 14373–14383 (2021). doi:10.1021/acsnano.1c03535

Susi, T., et al., Single-atom spectroscopy of phosphorus dopants implanted into graphene, 2D Materials 4, 021013 (2017). doi:10.1088/2053-1583/aa5e78

Single-atom spectroscopy

Recent advances in instrumentation have made it possible to identify the composition of materials at the atomic scale using electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM). When combined with modeling, even the exact nature of the bonding of single atoms can be elucidated.